Areas of application:
- Digital ICs (FPGA, microprocessors, microcontrollers, and so on);
Parameter | Value |
Architecture | «tester per channel» |
Number of universal I/O channels | 64 |
Max test vector rate | 400 Mbps |
Time resolution | 0.5 ns |
Vector memory depth | 8 Mb |
Vector formats | NRZ, DNRZ, R0, R1, SBC and others |
Driver
Output impedance | 50 Ohms |
Voltage range | -1 ... +7 V (optionally up to -2…+11.5 V) |
Max current load |
100 mА |
Comparator
Voltage range | -1 ... +7 V (optionally up to -2…+11.5) |
PMU
Number of high voltage PMU channels | 8 (built in IC PIN-electric, non relay commutation) |
Force/measure voltage range | -1 ... +11 V |
Force/measure current range | ± 32 mA |
Device power supply
Number of device power supply channels | 4 |
Force/measure voltage range | -1 ... +11 V |
Measure current range | ± 200 mА |
Software
Operating system | MS Windows (XP, Vista, 7) |
Programming language | MS Visual Studio C# |
Software features
Test development process based on test methods |
+ |
MS Access database integration |
+ |
Parallel test support up to 8 sites |
+ |
Test pattern formats translation («Nevod»,VCD, STIL) |
+ |
Stroboscopic analysis |
optional |
Logic analyzer |
optional |
Graphic representation of tested wafer |
optional |
Electronic suitability chart generation |
+ |
Test program debugger (online access) |
+ |
Test sequence editor |
+ |
Remote network access and control including integrated management of tester's groups |
optional |
Autocalibration |
+ |
Static analysis and reports generation |
+ |
SHMOO |
+ |
Reports generation |
+ |
Reliability
Continues work time | unlimited |
Lifelength | 50 000 hours |
Service time | 10 years |
Other features
Interface: USB 2.0 |
|
External measuring devices support |
|
Max power consumption |
150 W |
Cooling system type |
air-cooled |
Compressed air/vacuum |
not required |